Modeling the Effects of Surface Recombination Velocity in Scanning Photocurrent Microscopy for Ohmic-Contact Thin-Film Devices
Journal
Proceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD
Journal Volume
2022-September
ISBN
9781665478991
Date Issued
2022-01-01
Author(s)
Wei, Yu Chien
Abstract
We studied numerically the carrier transport and confirmed the feasibility of our scanning photocurrent microscopy model in the minority carrier decay length extraction under different surface recombination velocities at the surfaces of ohmic-contact thin-film devices.
Type
conference paper