Stress-induced hump effects of p-channel polycrystalline silicon thin-film transistors
Journal
IEEE Electron Device Letters
Journal Volume
29
Journal Issue
12
Pages
1332-1335
Date Issued
2008
Author(s)
Huang, C.-F.
Peng, C.-Y.
Yang, Y.-J.
Sun, H.-C.
Chang, H.-C.
Kuo, P.-S.
Chang, H.-L.
Liu, C.-Z.
SDGs
Type
journal article