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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Test Response Compaction in the Presence of Many Unknowns
Details
Test Response Compaction in the Presence of Many Unknowns
Journal
VTTW
Date Issued
2009-01
Author(s)
CHIEN-MO LI
Wei-Che Wang
James C.-M. Lim
Yi-Chih Sung
Amy Rao
Laung-Terng Wang
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/352494
Type
conference paper
