Controlled placement and electrical contact properties of individual multiwalled carbon nanotubes on patterned silicon chips
Journal
Applied Physics Letters
Journal Volume
84
Journal Issue
6
Pages
984-986
Date Issued
2004-02
Author(s)
Abstract
A reliable method for synthesis and controlled placement of MWNTs is presented. It is shown that Cr is a good candidate for contact material. It provides low Ohmic contact resistance with weak temperature and magnetic-field dependences.
Other Subjects
Chemical vapor deposition; Chromium; Crystal growth; Current voltage characteristics; Electric properties; Electrodes; Electron beam lithography; Energy gap; Magnetic field effects; Scanning electron microscopy; Silicon; Thermal effects; Multiwalled carbon nanotubes; Patterned silicon chips; Carbon nanotubes
Type
journal article