Observation of fatigue crack growth in ferroelectrics under electrical loading

Journal

Proceedings of SPIE - The International Society for Optical Engineering

Journal Volume

4699

Pages

51-63

Date Issued

2002

Author(s)

Shieh J.

Fleck N.A.

Huber J.E.

TZONG-LIN JAY SHIEH

DOI

10.1117/12.475016

URI

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036029588&doi=10.1117%2f12.475016&partnerID=40&md5=ba3ae722cf86dc91c1a06f8cdde31fdf

https://scholars.lib.ntu.edu.tw/handle/123456789/433277

Type

conference paper