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College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Emission wavelength control of Si-rich SiOx MOSLED by detuning vapor fluence and plasma power during PECVD growth
Details
Emission wavelength control of Si-rich SiOx MOSLED by detuning vapor fluence and plasma power during PECVD growth
Journal
Materials Research Society Symposium
Journal Volume
1074
Pages
186-191
Date Issued
2008
Author(s)
Lai, B.-H.
Pai, Y.-H.
Liu, C.-W.
GONG-RU LIN
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-70350316028&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/340880
Type
conference paper
