Raman scattering characterization of high-quality Cd1-xMnxTe films grown by metalorganic chemical vapor deposition
Resource
J. Appl. Phys.,64,6861-6863.
Journal
J. Appl. Phys
Journal Issue
64
Pages
6861-6863
Date Issued
1988-01
Date
1988-01
Author(s)
Feng, Z.C.
Sudharsanan, R.
Perkowitz, S.
Erbil, A.
Pollard, K.T.
Rohatgi, A.
Type
journal article