Novel high robustness RF ESD protection circuits applied to 5.8-GHz GaAs-based HBT amplifiers

Journal

IEEE Transactions on Microwave Theory and Techniques

Journal Volume

59

Journal Issue

3

Pages

687-698

Date Issued

2011

Author(s)

Huang, B.-J.

Lin, K.-Y.

Chiong, C.-C.

DOI

10.1109/TMTT.2011.2104790

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/497590

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-79952816015&doi=10.1109%2fTMTT.2011.2104790&partnerID=40&md5=3f66868c02cf4962bd740b34fd35202a

Type

journal article