A set-based mapping strategy for flash-memory reliability enhancement.

Journal

Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009

Pages

405-410

Date Issued

2009

Author(s)

Chu, Yuan-Sheng

Hsieh, Jen-Wei

Chang, Yuan-Hao

DOI

URI

URL

Type

conference paper