Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Science / 理學院
Chemistry / 化學系
Convergent Electron Beam Induced Growth of Copper Nanostructures: Evidence of the Importance of a Soft Template
Details
Convergent Electron Beam Induced Growth of Copper Nanostructures: Evidence of the Importance of a Soft Template
Journal
Langmuir
Journal Volume
20
Journal Issue
2
Pages
279-281
Date Issued
2004
Author(s)
Yen, M.-Y.
CHING-WEN CHIU
Chen, F.-R.
Kai, J.-J.
Lee, C.-Y.
Chiu, H.-T.
DOI
10.1021/la035470w
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-0942299090&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/307038
Type
journal article