Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

Journal

European Physical Journal B

Journal Volume

79

Journal Issue

2

Pages

153-162

Date Issued

2011

Author(s)

Liang, J.J.

Hsu, S.Y.

Lin, L.K.

Tsai, T.C.

Lee, S.F.

DOI

10.1140/epjb/e2010-10051-y

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-79951513693&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/363105

Type

journal article