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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Transition Fault Diagnosis Using At-speed Test Patterns
Details
Transition Fault Diagnosis Using At-speed Test Patterns
Journal
IEEE Int’l Workshop on RTL and High Level Testing
Date Issued
2009-01
Author(s)
CHIEN-MO LI
Shang-Feng Chao
Jheng-Yang Ciou
CHIEN-MO LI
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/352488
Type
conference paper