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  4. Evidence for Primal sp 2 Defects at the Diamond Surface: Candidates for Electron Trapping and Noise Sources
 
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Evidence for Primal sp 2 Defects at the Diamond Surface: Candidates for Electron Trapping and Noise Sources

Journal
Advanced Materials Interfaces
Journal Volume
6
Journal Issue
3
ISSN
21967350
Date Issued
2019
Author(s)
Stacey, Alastair
Dontschuk, Nikolai
JYH PIN CHOU  
Broadway, David A.
Schenk, Alex K.
Sear, Michael J.
Tetienne, Jean-Philippe
Hoffman, Alon
Prawer, Steven
Pakes, Chris I.
Tadich, Anton
de Leon, Nathalie P.
Gali, Adam
Hollenberg, Lloyd C. L.
DOI
10.1002/admi.201801449
URI
https://www.scopus.com/record/display.uri?eid=2-s2.0-85057769899&origin=resultslist
https://scholars.lib.ntu.edu.tw/handle/123456789/721371
Abstract
Many advanced applications of diamond materials are now being limited by unknown surface defects, including in the fields of high power/frequency electronics and quantum computing and quantum sensing. Of acute interest to diamond researchers worldwide is the loss of quantum coherence in near-surface nitrogen-vacancy (NV) centers and the generation of associated magnetic noise at the diamond surface. Here for the first time is presented the observation of a family of primal diamond surface defects, which is suggested as the leading cause of band-bending and Fermi-pinning phenomena in diamond devices. A combination of density functional theory and synchrotron-based X-ray absorption spectroscopy is used to show that these defects introduce low-lying electronic trap states. The effect of these states is modeled on band-bending into the diamond bulk and it is shown that the properties of the important NV defect centers are affected by these defects. Due to the paramount importance of near-surface NV center properties in a growing number of fields, the density of these defects is further quantified at the surface of a variety of differently-treated device surfaces, consistent with best-practice processing techniques in the literature. The identification and characterization of these defects has wide-ranging implications for diamond devices across many fields. © 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Subjects
defects
diamond
Fermi-level pinning
NEXAFS
surfaces
Publisher
Wiley-VCH Verlag
Description
Article number 1801449
Type
journal article

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