Optimizing wavelets for the analysis of fMRI data
Journal
Proceedings of SPIE - The International Society for Optical Engineering
Journal Volume
4119
Date Issued
2000-12-01
Author(s)
Abstract
fMRI is a new and powerful technique for observing the activity of the brain while a subject is performing some cognitive or motor task. The original method in the case of non-stationary Gaussian noise by replacing the original z-test is improved by a t-test that takes into account the variability of each wavelet coefficient separately. Various brands of fractional spline wavelets which are indexed by a continuously-varying order parameter ∝ are considered. An extensive series of tests using simulated data are performed. It is observed that there is a strongly optimal value of α and a best number of scales that minimizes the error.
Type
conference paper