Evidence of SiSiGe heterojunction roughness scattering

Journal

Applied Physics Letters

Journal Volume

85

Journal Issue

21

Pages

4947-4949

Date Issued

2004

Author(s)

Liu, C.W.

Lee, M.H.

Lee, Y.C.

Chen, P.S.

Yu, C.-Y.

Wei, J.-Y.

Maikap, S.

DOI

10.1063/1.1828224

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-19144372900&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/309374

Type

journal article