Extraction of Complex Permittivity of Dielectrics on Package from W-band to D-band
Journal
Proceedings - Electronic Components and Technology Conference
Journal Volume
2021-June
Pages
564-569
Date Issued
2021
Author(s)
Abstract
In this paper, a simple method of extracting dielectric material is proposed and copper surface roughness is taken into consideration. The measured results from W-band to D-band are shown to verify the proposed method of extracting complex permittivity of dielectrics. Besides, to validate the proposed transmission line technique, the full sets of complex Sparameters with an appropriate “through-reflect-line” (TRL) calibration pattern are measured as well. It also allows accurate determination of the dielectric constant and loss of thin sheet substrate materials. A great consistency between transmission line technique without calibration and TRL calibration method represents that systematic errors are small. In addition, different samples within the same set of packaging are measured and used to extract dielectric constant and loss tangent, which agree well with each other. © 2021 IEEE
Subjects
Complex permittivity; D band; Dielectric constant; Dielectric loss tangent; Dielectric-material measurements; Packaging material
Other Subjects
Calibration; Dielectric losses; Dielectric materials; Electric lines; Extraction; Packaging; Packaging materials; Surface roughness; Systematic errors; Complex permittivity; Copper surface; D band; Dielectric loss tangent; Dielectric-material measurement; Material measurements; Measured results; SIMPLE method; Transmission line technique; W bands; Permittivity
Type
conference paper