近場光學寫入與磁通量讀取的單層CoTbPt記錄薄膜之研製
Date Issued
2004
Date
2004
Author(s)
郭博成
DOI
922216E002019
Abstract
This work presents a single-layer
CoTbPt film for near-field optical write and
magnetic flux detection recording medium
application. Co77.52-XTb22.5PtX films with x =
0 – 14 at.% are fabricated on glass substrate by
dc magnetron sputtering. The magnetic film is
sandwiched between SiNx protective layers to
prevent oxidization. The effects of
non-magnetic element Pt content on the
magnetic properties and microstructure of the
film are investigated. X-ray diffraction and
transmission electron microscope diffraction
patterns revealed that all the films are
amorphous. It shows that substituting a small
amount of Co for the nonmagnetic element Pt
will increase the saturation magnetization Ms,
the perpendicular remanence Mr⊥, and the
perpendicular coercivity Hc⊥ of the Co77.5Tb22.5
film. It is found that the saturation
magnetization Ms of the Co75.3Tb22.5Pt2.2 film
is about 245 emu/cm3, the perpendicular
squareness S⊥ is about 0.8, perpendicular
coercivity Hc⊥ is about 2100 Oe and the
perpendicular remanence Mr⊥ is 190 emu/cm3
at room temperature. It is a promising
candidate for near-field optical write and
magnetic flux detection recording media.
Subjects
magnetron sputtering
CoTbPt film
amorphous thin films
magnetic properties
Publisher
臺北市：國立臺灣大學材料科學與工程學研究所
Type
report
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