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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
SDC-TPG: A deterministic zero-inflation parallel test pattern generator
Details
SDC-TPG: A deterministic zero-inflation parallel test pattern generator
Journal
Asian Test Symposium
Date Issued
2015
Author(s)
C.-H. Chang
K.-W. Yeh
J.-L. Huang
L.-T. Wang
JIUN-LANG HUANG
DOI
10.1109/ats.2015.15
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429670
Type
conference paper