Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)
Details
Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)
Journal
Applied Physics Letters
Journal Volume
67
Date Issued
1995
Author(s)
CHEE-WEE LIU
St. Amour, A.
Liu, C.W.
Sturm, J.C.
Lacroix, Y.
Thewalt, M.L.W.
CHEE-WEE LIU
DOI
10.1063/1.115316
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-0029543599&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/316586
Type
journal article
