Defects of Base Metal Electrode Layers in Multi-Layer Ceramic Capacitor
Resource
Journal of the American Ceramic Society 88 (8): 2328-2331
Journal
Journal of the American Ceramic Society
Journal Volume
88
Journal Issue
8
Pages
2328-2331
Date Issued
2005
Date
2005
Author(s)
Yu, Bang-Ying
Abstract
An ultra-thin Ni-based metal used as the electrode layer in multilayer ceramic capacitor determines the dielectric performance of the capacitor. The warpage and the continuity of the inner electrode layers, and a dihedral angle between BaTiO3 layers and metal electrodes of two ceramic capacitors (X7R and X5R) were characterized by optical microscopy and scanning/transmission electron microscopes. The results show that the warpage of the chips is closely related to the discontinuity of the inner electrode. The discontinuity takes place mainly because of Rayleigh instability of the Ni layer, but is less induced by the tensile stress from sintering.
Other Subjects
Barium titanate; Defects; Dielectric properties; Electrodes; Multilayers; Nickel; Sintering; Tensile stress; Dielectric performance; Metal electrodes; Multi-layer ceramic capacitors; Rayleigh instability; Ceramic capacitors
Type
journal article
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