Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits

Journal

IEEE Asian Test Symposium

Date Issued

2009-01

Author(s)

Shiue-Tsung Shen,

Wei-Hsiao Liu,

En-Hua Ma,

J. C.-M. Li,

I-Chun Cheng,

DOI

10.1109/TEST.2009.5355808

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/352490

Type

conference paper