Tribological interaction between one dimensional nano material and semi-conductor surface
Date Issued
2010
Date
2010
Author(s)
Hsu, Jung-Hui
Abstract
The target of this dissertation is the tribological interaction between one dimension nano material and semi-conductor surface. One dimension nano materials are manipulated in an atomic force microscope (AFM), and tribological properties of nanotube-surface are discovered. So we can use the information of the tribological properties of nanotube-surface to design nano devices or energy storage. In our experiments, we adopted the multi-walled carbon nanotubes (MWCNTs) and boron nitride nanotubes (BNNT) to be one dimension nano material. Silica and silicon which properties both are semi-conductor are used as substrate materials. Therefore, we discussed the tribological interaction between one dimension nano material and semi-conductor surface in detail.
The tribological interaction between MWCNTs and silica surface using lateral manipulation in the AFM. The MWCNT is mechanically manipulated by a pyramidal silicon probe of an AFM using the same scan mechanism as in the imaging mode. With a controlled normal force of the AFM probe, it was found that lateral force applied to the MWCNT could overcome the tribological adhesion between MWCNT and silica surface, causing individual MWCNT to rotate on the silica. According to the results, the shear stresses due to tribological interacting with the MWCNTs and the silica are 59.6 MPa and 64.8 MPa for the MWCNT 1 (100 nm diameter) and the MWCNT 2 (60 nm diameter), respectively. Experimental results show that the shear stress increases with the increasing rotation angle for each manipulation, from which we determine the linear fitting function. In addition, we determine the relationship between push point and pivot point to realize the rotation behavior. The implications of tribological interaction between the MWCNTs and silica surface are discussed in detail.
The tribological interaction between BNNTs and silicon was studied with lateral manipulation in AFM. The BNNTs was mechanically manipulated by the lateral force of an AFM pyramidal silicon probe using the scan mechanism in the imaging mode. With a controlled normal force of the AFM probe and the lateral motion, the lateral force applied to the BNNTs could overcome the tribological interaction between BNNTs and silicon surface. The individual BNNT is forced to slide and rotate on the silicon surface. Based on the recorded force curve, the calculated shear stress due to surface adhesion is 0.5 GPa. And the specific sliding energy loss is 0.2 J/m2. Comparing BNNTs and CNTs [24], the shear stress and specific sliding energy loss of BNNTs are an order of magnitude larger than that of CNTs. Therefore, the results show that the tribological interaction between BNNTs and silicon surface is higher than that of CNTs.
Subjects
atomic force microscope
multi-walled carbon nanotubes
boron nitride nanotube
silicon
silica
shear stress
specific sliding energy loss
tribological interaction
Type
thesis
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