Charge storage and data retention characteristics of forming gas-annealed Gd2O3-nanocrystal nonvolatile memory cell.

Journal

Microelectronics Reliability

Journal Volume

52

Journal Issue

8

Pages

1627-1631

Date Issued

2012

Author(s)

Wang, Jer-Chyi

Lin, Chih-Ting

Huang, Chi-Hsien

Lai, Chao-Sung

Liao, Chin-Hsiang

DOI

URI

URL

Type

journal article