Efficaciously Modeling Exterior Electrostatic Problems with Singularity for Electron Devices

Resource

IEEE, Circuits and Devices Magazine 20 (5): 25-34

Journal

Circuits and Devices Magazine

Journal Issue

5

Pages

-

Date Issued

2004

Date

2004

Author(s)

Liao, Y.S.

Chyuan, S,W.

Chen, J.T.

URI

Type

journal article

File(s)

Name

35.pdf

Size

857.1 KB

Format

Adobe PDF

Checksum

(MD5):c5cf798e1101f7d03ce4d16c0029128d