Hot-Carrier Effect and Nanometer Metal Enabling Si-Based Mid-Infrared Detection Beyond 5μm of Wavelength
Journal
IEEE Photonics Journal
Journal Volume
16
Journal Issue
3
Start Page
1
End Page
10
ISSN
1943-0655
1943-0647
Date Issued
2024-06
Author(s)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Type
journal article