Process Monitoring for LCD Defect Inspectionith Line-Scan Cameras
Date Issued
2008
Date
2008
Author(s)
Chen, Wei-Shui
Abstract
In this thesis, we develop a process monitoring algorithm to detect whether the processes running on the LCD defect inspection system fail or are unusually busy and thereafter correct them. We aim to implement this method on the LCD (Liquid Crystal Display) defect inspection system with line-scan cameras. Because current LCD defect inspection systems comprise many CCD (Charge-Coupled Device) cameras and transferring image data to industrial computers with Camera Link for further processing, the algorithm must be simple, fast, and with low computational complexity to fit in with real-time environment. Another important issue in process status determination is how to minimize false alarm rate of the criteria we design.
Subjects
process monitoring
LCD
cpu usage
memory usage
Type
thesis
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ntu-97-R96944024-1.pdf
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