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College of Science / 理學院
Applied Physics / 應用物理研究所
Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates
Details
Reliability studies of wafer-bonded InGaAs PIN photodetectors on GaAs substrates
Journal
Lasers and Electro-Optics, 1996. CLEO'96
Pages
492
Date Issued
1996
Author(s)
Ejeckam, FE
Chua, CL
Zhu, Z-H
Lo, YH
MINGHWEI HONG
Mannaerts, JP
Bhat, Ritesh
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/323242
Type
conference paper
