Compression-aware Automatic Test Pattern Generation based on Skew Insertion Technique in the Broadcast Environment
Date Issued
2010
Date
2010
Author(s)
Lin, Chien-Ju
Abstract
As the advance of the technology and the design complexity increases, test compression techniques has become mandatory due to the growing test data volume and high ATE test cost. Several broadcast based technique has been proposed to address this issue by reordering the scan chains into an optimal structure. However, the reordering of the scan chains generally impact the timing and increases routing overhead.
Skew insertion provides an alternative solution. By inserting skews in front of the scan chains to delay the value received, the test patterns become encodable in the broadcast environment. However, conventional methods usually manipulate on the pre generated test sets, thus the widely-adopted dynamic compaction technique cannot be utilized afterward to further increase the compression ratio. Moreover, if an encodable solution cannot be found, the additional topping serial pattern will greatly degrades the compression ratio.
This thesis determines the encodable skew configuration during ATPG, so as to avoid the conflict assignment in an early stage. The core technology is the compression aware ATPG, and the partial serial technique is further proposed to alleviate the high linear dependency of the broadcast constraints.
Effectiveness of the proposed technique is validated with ISCAS89 and ITC99 benchmark circuit. The proposed technique generally provide high data reduction ratio, and without the need of the reordering the scan chains.
Subjects
Compression-aware
Automatic Test Pattern Generation
Skew Insertion
Broadcast test data compression
Scan testing
SDGs
Type
thesis
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