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College of Engineering / 工學院
Mechanical Engineering / 機械工程學系
A novel method for measuring thick film thermal conductivity
Details
A novel method for measuring thick film thermal conductivity
Journal
2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems
Pages
1052-1056
Date Issued
2010
Author(s)
Sun W.-C.
Huang M.-J.
Chien H.-C.
Chang T.-Y.
Yao D.-J.
DOI
10.1109/NEMS.2010.5592572
URI
https://www.scopus.com/inward/record.uri?eid=2-s2.0-78649302871&doi=10.1109%2fNEMS.2010.5592572&partnerID=40&md5=8b558bd4456391e467352919cddb58c5
https://scholars.lib.ntu.edu.tw/handle/123456789/411144
Type
conference paper
