Fabrication and characterization of quantum Hall devices for the resistance standard at CMS
Journal
Conference on Precision Electromagnetic Measurements
Pages
633-634
Date Issued
2010
Author(s)
Huang, C.F.
Hang, D.R.
Huang, C.-Y.
Chen, S.-F.
Lin, L.-H.
Hsiao, J.C.
Lin, T.-L.
Cheng, K.A.
Type
conference paper