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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique
Details
Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique
Journal
IEEE Asian Test Symposium
Date Issued
2007-01
Author(s)
CHIEN-MO LI
B.-H. Chen
Wei-Chuang Kao
Bin-Chuan Bai
Shyue-Tsong Shen
CHIEN-MO LI
DOI
10.1109/ATS.2007.74
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/334019
Type
conference paper
