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An Assessment of Testing-Effort Dependent Software Reliability Growth Models
Resource
IEEE Transactions on Reliability 56 (2): 198-211
Journal
IEEE Transactions on Reliability
Journal Volume
56
Journal Issue
2
Pages
198-211
Date Issued
2007
Date
2007
Author(s)
Huang, Chin-Yu
Kuo, Sy-Yen
Lyu, M.R.
Type
journal article
File(s)
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Name
33.pdf
Size
431.74 KB
Format
Adobe PDF
Checksum
(MD5):5eaeb5823b6487b9d75813790544651a