Improved Process Induced Threshold Voltage Variability in Negative Capacitance Junctionless Transistors
Journal
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Part Of
IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024
ISBN (of the container)
979-835037152-9
Date Issued
2024-03-03
Author(s)
Event(s)
2024 8th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2024
Publisher
IEEE
Type
conference paper