Full-field microsurface profilometry using image correlation without vertical scanning

Journal

Optics Letters

Journal Volume

44

Journal Issue

14

Pages

3534-3537

Date Issued

2019

Author(s)

Wu, G.-W.

Nguyen, D.T.

Chen, L.-C.

LIANG-CHIA CHEN

DOI

10.1364/OL.44.003534

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/447815

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85069616578&doi=10.1364%2fOL.44.003534&partnerID=40&md5=b4858d047185968cf1c83f8ab250361b

SDGs

[SDGs]SDG3

[SDGs]SDG9

Type

journal article