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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Degradation and annealing characteristics of amorphous silicon-hydrogen alloys after a long-time test
Details
Degradation and annealing characteristics of amorphous silicon-hydrogen alloys after a long-time test
Journal
Journal of Applied Physics
Journal Volume
62
Journal Issue
5
Pages
1856-1860
Date Issued
1987
Author(s)
Tzeng, W.-J.
Tsai, H.-K.
SI-CHEN LEE
DOI
10.1063/1.339569
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/498789
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-6044225852&doi=10.1063%2f1.339569&partnerID=40&md5=58ce815067c4e4b1474a6908f901e5b7
Type
journal article