Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam
Journal
Optics Letters
Journal Volume
34
Journal Issue
15
Pages
2246-2248
Date Issued
2009
Author(s)
Abstract
Tip-enhanced Raman spectroscopy with a spatial resolution of 25 nm is conducted on a sample of graphite that has been exposed to a 50 keV focused Ga ion beam with a diameter of 20 nm. The G mode located at 1579 cm(-1) does not exhibit a measurable tip enhancement, while the D mode at 1364 cm(-1) is significantly enhanced. A method is proposed to calculate the enhancement factor of anisotropic materials due to the electromagnetic field using the measured signal enhancement induced by the tip.
SDGs
Publisher
Optical Society of America (OSA)
Type
journal article