Guest Editorial to the Special Section on the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC' 09)
Journal
IEEE Transactions on Instrumentation and Measurement
Journal Volume
59
Journal Issue
12
Pages
1-2
Date Issued
2010
Author(s)
Abstract
The six articles in this special issue were originally presented at the 2009 International Conference on Electromagnetic Near-Field Characterization and Imaging (ICONIC'09), held at the Oriental Institute of Technology, Taipei, Taiwan, on June 24-26, 2009.
Type
journal article