Depth-profile study of the electronic structures at Ga<inf>2</inf>O <inf>3</inf>(Gd<inf>2</inf>O<inf>3</inf>) and Gd<inf>2</inf>O<inf>3</inf>-GaN interfaces by X-ray photoelectron spectroscopy

Depth-profile study of the electronic structures at Ga2O 3(Gd2O3) and Gd2O3-GaN interfaces by X-ray photoelectron spectroscopy

Journal

Journal of Crystal Growth

Journal Volume

278

Pages

624-628

ISBN

10.1016/j.jcrysgro.2004.12.128

Date Issued

2005

Author(s)

Lay, T.S.

Liao, Y.Y.

Hung, W.H.

Kwo, J.

Mannaerts, J.P.

URI

URL

Type

conference paper