Charge-based capacitance measurement for bias-dependent capacitance

Journal

IEEE Electron Device Letters

Journal Volume

27

Journal Issue

5

Pages

390-392

Date Issued

2006

Author(s)

Chang, H.-W.

Lu, T.-C.

King, Y.-C.

Ting, W.

Ku, Y.-H.J.

Lu, C.-Y.

DOI

10.1109/LED.2006.873368

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-33646236910&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/324063

Type

journal article