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College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Reliability screening of a-Si TFT circuits: Very-low voltage and I <inf>DDQ</inf> Testing
Details
Reliability screening of a-Si TFT circuits: Very-low voltage and I <inf>DDQ</inf> Testing
Journal
IEEE/OSA Journal of Display Technology
Journal Volume
6
Journal Issue
12
Pages
592-600
Date Issued
2010
Author(s)
Shen, S.-T.
Liu, C.
Ma, E.-H.
Cheng, I.-C.
Li, J.C.-M.
I-CHUN CHENG
CHIEN-MO LI
DOI
10.1109/JDT.2010.2060469
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-78449309721&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/357983
Type
journal article