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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments
Details
Design and control of phase-detection mode atomic force microscopy for cells precision contour reconstruction under different environments
Journal
American Control Conference
Pages
5488-5493
Date Issued
2013
Author(s)
Wu, J.-W.
Chen, J.-J.
Huang, K.-C.
Chen, C.-L.
Lin, Y.-T.
Chen, M.-Y.
Fu, L.-C.
LI-CHEN FU
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84883548958&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/380127
Type
conference paper
