Diagnosis of Resistive-Open and Stuck-Open Defects in Digital CMOS ICs

Resource

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 24 (11): 1748-1759

Journal

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

Journal Volume

24

Journal Issue

11

Pages

1748-1759

Date Issued

2005

Date

2005

Author(s)

Li, James Chien-Mo

McCluskey, Edward J.

URI

Type

journal article

File(s)

Name

06.pdf

Size

319 KB

Format

Adobe PDF

Checksum

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