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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
An On-line Variable Speed Scanning Method with Machine Learning Based Feedforward Control for Atomic Force Microscopy
Details
An On-line Variable Speed Scanning Method with Machine Learning Based Feedforward Control for Atomic Force Microscopy
Journal
2019 12th Asian Control Conference, ASCC 2019
Pages
138-143
Date Issued
2019
Author(s)
Liu, Y.-L.
Huang, C.-C.
Chen, H.-C.
LI-CHEN FU
URI
https://www.scopus.com/inward/record.url?eid=2-s2.0-85069930133&partnerID=40&md5=71391946e5878d0c75855ddff68eb3d1
https://scholars.lib.ntu.edu.tw/handle/123456789/559095
Type
conference paper
