otational positioning system adapted to atomic force microscope for measuring anisotropic surface properties

Resource

REVIEW OF SCIENTIFIC INSTRUMENTS, 82(11), 113710

Journal

Review of Scientific Instruments

Journal Volume

82

Journal Issue

11

Pages

-

Date Issued

2011

Date

2011

Author(s)

Liao, H.-S.

Juang, B.-J.

Chang, W.-C.

Lai, W.-C.

Huang, K.-Y.

Chang, C.-S.

DOI

URI

Type

journal article

File(s)

Name

161.pdf

Size

23.42 KB

Format

Adobe PDF

Checksum

(MD5):7c99fe7b29de92ae54d27ff7c2b49a51