DC Analysis for Flexible TFT Circuits Considering Process Variation, Aging Effects, and Bending Effects
Date Issued
2011
Date
2011
Author(s)
Ma, En-Hua
Abstract
Thin-film transistors (TFTs) technology is widely used in large area, flexible and printed electronics. Flexible TFT technology has many advantages over conventional silicon technology such as low cost and short manufacturing time. Currently the problem of flexible TFT technology is the change in mobility when the TFT is bent and the shift in threshold voltage is fast when TFT is operated. With those two issues, the yield of TFT can be reduced significantly. This paper presents a spice-based simulator, FlexiAnalyzer, for flexible TFT circuits. This simulator performs four types of analysis: yield analysis, aging analysis, performance analysis, and weak-spot analysis. This simulator considers three important effects: (1) threshold voltage variation caused by manufacturing process, (2) threshold voltage shift due to aging effect, and (3) mobility change due to bending effect. Six different OLED drivers using 8um amorphous silicon TFT technology were simulated. Experimental results show significant yield difference among designs. The proposed tool provides solutions for designers to evaluate the performance and yield of flexible TFT circuits.
Subjects
Flexible TFT Circuits
Circuit Analyzer
Aging Effect
Bending Effect
Type
thesis
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