Test Response Compaction In The Presence Of Many Unknowns
Date Issued
2009
Date
2009
Author(s)
Wang, Wei-Che
Abstract
This thesis presents a Row-LFSR-Column (RLC) masking technique that is capable of handling many unknowns in the test responses. Unlike traditional X-masking techniques, which perform unknown masking before the test compactor, the proposed technique masks unknowns after the test compactor. This characteristic makes RLC mask very easy to be applied to existing test response compaction tool and further improves the test response compaction ratio. With three novel mechanism (direct row, direct column, and LFSR column masking), RLC masks all unknowns in the test response using a very short LFSR. Experiment on a real design shows that, RLC mask provides more than 17K times test response compaction for up to 41.8% unknowns. Furthermore, a segmented RLC architecture is presented in order to deal with large industrial designs. By providing a very high test response compaction ratio, the proposed technique enables massive multisite testing to drive down the test cost significantly.
Subjects
compaction
LFSR
test response
Type
thesis
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