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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Analysis of the Leakage Effect in a Pipelined ADC with Nanoscale CMOS Technologies
Details
Analysis of the Leakage Effect in a Pipelined ADC with Nanoscale CMOS Technologies
Journal
IEEE VLSI-DAT
Date Issued
2013-04
Author(s)
C-Y Lin Y-C Huang
TAI-CHENG LEE
DOI
10.1109/VLDI-DAT.2013.6533874
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/381707
Type
conference paper