Characterizing the thickness dependence of epitaxial GaN grown over GaN nanocolumns using X-ray diffraction

Journal

Journal of Crystal Growth

Journal Volume

310

Journal Issue

13

Pages

3159-3162

Date Issued

2008

Author(s)

CHIH-CHUNG YANG

Shiao, W.-Y.

Tang, T.-Y.

Chen, Y.-S.

Averett, K.L.

Albrecht, J.D.

CHIH-CHUNG YANG

DOI

10.1016/j.jcrysgro.2008.04.006

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-44549085826&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/339010

SDGs

[SDGs]SDG15

Type

journal article