Electric field enhancement by a nanometer-scaled conical metal tip in the context of scattering-type near-field optical microscopy

Journal

Applied Physics Letters

Journal Volume

88

Journal Issue

10

Pages

104101-1 - 104101-3

Date Issued

2006

Author(s)

Goncharenko, A.V.

Dvoynenko, M.M.

Chang, H.-C.

DOI

URI

Publisher

American Institute of Physics

Type

journal article