Survey of Scan Chain Diagnosis

Journal

IEEE Design & Test of Computers

Journal Volume

25

Journal Issue

3

Pages

240-248

Date Issued

2008-01

Author(s)

Y. Huang

R Guo

W.T. Cheng

DOI

10.1109/MDT.2008.83

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/343000

Type

journal article